| Expertise: | Sample (process results) analysis |
| Additional information: | Optical microscopes SEM, Surface profiler and AFM Resistance measurement by two probes and four probes methods. |
| Equipement: | • Optical microscope Olympus BX51 with CCD camera • Optical microscope Nikon Eclipse LV100 Nikon Eclipse LV100 with CCD camera • Scanning electron microscope JEOL JSM-6490 LV with EDS/WDS • Stylus profiler Dektak 150+ • AFM Veeco Dimension Edge • Keithley 2600A System Source Meter |
| Contact person: | Paulius Gečys |
| Email: | paulius.gecys@ftmc.lt |
| Category: | 2. Sample (process results) analysis |
| Laboratory: | Lithuania - FTMC |
