Hub partner: FTMC
Additional information:
Optical microscopes
SEM, Surface profiler and AFM
Resistance measurement by two probes and four probes methods.
Equipement:
• Optical microscope Olympus BX51 with CCD camera
• Optical microscope Nikon Eclipse LV100 Nikon Eclipse LV100 with CCD camera
• Scanning electron microscope JEOL JSM-6490 LV with EDS/WDS
• Stylus profiler Dektak 150+
• AFM Veeco Dimension Edge
• Keithley 2600A System Source Meter
Contact: Paulius Gečys
Email: paulius.gecys@ftmc.lt
Competence category: Sample (process results) analysis