| Name: | |
| Equipment: | Keithley Model 2400 |
| Applications: | IV Electrical characterization of solar cells. Resistance measurement. Four point probe. TLM measurement. |
| Properties: | Arc Xe Lamp Housings 300 watt. Keithley Model 2400 sourceMeter. Dark box for dark Current-Voltage measurements. |
| Tested materials: | Amorphous silicon thin films. cSi solar cells. CIGS thin films |
| Category: | ANALYSIS AND CHARACTERIZATION |
| Laboratory: | Spain - UPM |
Specifications
| Method | Min feature size | Working area | Process speed |
| Electrical | 4 cm2 ensure. < 10x10cm2 |