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Name:
Equipment: Keithley Model 2400
Applications: IV Electrical characterization of solar cells. Resistance measurement. Four point probe. TLM measurement.
Properties: Arc Xe Lamp Housings 300 watt. Keithley Model 2400 sourceMeter. Dark box for dark Current-Voltage measurements.
Tested materials: Amorphous silicon thin films. cSi solar cells. CIGS thin films
Category: ANALYSIS AND CHARACTERIZATION
Laboratory: Spain - UPM
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Specifications

Method Min feature size Working area Process speed
Electrical 4 cm2 ensure. < 10x10cm2