Name: | |
Equipment: | Keithley Model 2400 |
Applications: | IV Electrical characterization of solar cells. Resistance measurement. Four point probe. TLM measurement. |
Properties: | Arc Xe Lamp Housings 300 watt. Keithley Model 2400 sourceMeter. Dark box for dark Current-Voltage measurements. |
Tested materials: | Amorphous silicon thin films. cSi solar cells. CIGS thin films |
Category: | ANALYSIS AND CHARACTERIZATION |
Laboratory: | Spain - UPM |
Specifications
Method | Min feature size | Working area | Process speed |
Electrical | 4 cm2 ensure. < 10x10cm2 |