| Expertise: | Sample (process results) analysis |
| Additional information: | In-process measurement of electrical properties Optical microscopy: bright light, dark light, stereo, interference, DIC, CCD, profiler SEM with EDX various AFM techniques Metallographic cross sectioning, Cross beam workstation FIB/SEM Raman Microscope λexc:{632, 532, 457 nm} XPS, XRD |
| Equipement: | • JenaVal • Micromap • ULTRA 55 with Quantax • Bruker fast scan, Nanoscope • AURIGA • LabRam |
| Contact person: | Klaus Zimmer |
| Email: | klaus.zimmer@iom-leipzig.de |
| Category: | 2. Sample (process results) analysis |
| Laboratory: | Germany - IOM |
